Relative X-ray cross sections and sensitivity of PIXE and RBS in surface analysis-Reference-Cited by-同舟云学术

Relative X-ray cross sections and sensitivity of PIXE and RBS in surface analysis

Published:1986-04 Issue:1-6 Volume:15 Page:407-409
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Bergsaker H.,Braun M.,Emmoth B.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Heavy ion backscattering spectrometry (HIBS) — An improved technique for trace element detection;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1989-06