High sensitivity Rutherford backscattering spectrometry using multidetector digital pulse processing
Author:
Affiliation:
1. Department of Chemistry, KU Leuven, Celestijnenlaan 200 F, B-3001 Leuven, Belgium and imec, Kapeldreef 75, B-3001 Leuven, Belgium
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
http://avs.scitation.org/doi/pdf/10.1116/1.5016033
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