The first observation of RHEED intensity oscillation during the growth of a metal-metal multilayered film by MBE and the electrical resistivity measurement of Mo/Al multilayered films grown by rf sputtering
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference8 articles.
1. Dynamics of film growth of GaAs by MBE from Rheed observations
2. Temporal intensity variations in RHEED patterns during film growth of GaAs by MBE
3. One Atomic Layer Heterointerface Fluctuations in GaAs-AlAs Quantum Well Structures and Their Suppression by Insertion of Smoothing Period in Molecular Beam Epitaxy
4. Phase-Locked Epitaxy Using RHEED Intensity Oscillation
5. Thickness periodicity in the Auger line shapes from epitaxial (111) Pd/ (111) Cu films
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Epitaxial Growth of Metallic Structures;Ultrathin Magnetic Structures I;1994
2. Molecular Beam Epitaxy;Thin Film Processes;1991
3. Influence of adsorption-site geometry and diffusion on thin-film growth: Pt/Pd(100);Ultramicroscopy;1989-09
4. Use of LEED intensity oscillations in monitoring thin film growth;Langmuir;1988-09
5. Quantitative sputtering;Surface and Interface Analysis;1988-01
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