Thickness periodicity in the Auger line shapes from epitaxial (111) Pd/ (111) Cu films
Author:
Publisher
American Vacuum Society
Subject
General Engineering
Link
http://avs.scitation.org/doi/pdf/10.1116/1.570929
Cited by 26 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Pd growth on Cu(111): stress relaxation through surface alloying?;Surface Science;2004-07
2. Submonolayer growth of Pd on Cu(111) studied by scanning tunneling microscopy;Surface Science;1998-06
3. Perturbations in applied electron spectroscopy caused by the vicinity of the surface;Journal of Electron Spectroscopy and Related Phenomena;1987-01
4. The first observation of RHEED intensity oscillation during the growth of a metal-metal multilayered film by MBE and the electrical resistivity measurement of Mo/Al multilayered films grown by rf sputtering;Vacuum;1986-11
5. The First Observation of RHEED Intensity Oscillation during the Growth of Cu/Mo Multi-Layered Films;Journal of the Physical Society of Japan;1986-08-15
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