Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Cited by
11 articles.
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1. Auger Spectroscopy;digital Encyclopedia of Applied Physics;2003-04-15
2. Characterization of BiSrCaCuO thin films by the complementary use of IBA and AES analytical techniques;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09
3. Removal of Fluorocarbon Residues on CF 4 / H 2 Reactive‐Ion‐Etched Silicon Surfaces Using a Hydrogen Plasma;Journal of The Electrochemical Society;1991-01-01
4. Diagnostic Techniques;Microelectronic Materials and Processes;1989
5. A sputtered neutral mass spectrometer with high current, low energy ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-12