Design and performance of quadrupole-based SIMS instruments: a critical review
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference116 articles.
1. Secondary ion mass spectrometry as a means of surface analysis
2. The sputtering process and sputtered ion emission
3. Aspects of quantitative secondary ion mass spectrometry
4. Secondary ion mass analysis, Technique for three-dimensional characterization
5. Ion microprobe analysers. History and outlook
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