Amorphisation during elevated temperature implantation

Author:

Carter G,Nobes MJ,Elliman RG

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference28 articles.

1. Ion Implantation of Semiconductors;Carter,1976

2. Radiation Effects in Semiconductors;Swanson,1971

3. Crystalline to amorphous transformation in ion‐implanted silicon: a composite model

4. Defects production and annealing in self‐implanted Si

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1. Amorphous zone evolution in Si during elevated temperature ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-03

2. The Avrami-Johnson-Mehl model, heterogeneous nucleation and ion-irradiation-induced phase changes;Philosophical Magazine A;1999-11

3. Doping and processing epitaxial GexSi1−x films on Si(100) by ion implantation for Si-based heterojunction devices applications;Journal of Electronic Materials;1998-05

4. A phenomenological model of the fluence, flux and temperature dependence of amorphisation in heavy ion implanted semiconductors;Radiation Effects and Defects in Solids;1997-08

5. Defect accumulation during room temperature N+ irradiation of silicon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-12

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