Author:
Ishikawa Kazuhiko,Yamano Hitomi,Asada Katsuhiko,Iwata Koichi,Ueda Masahiro
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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4. Ishikawa K, Yamano H, Kagawa K, Asada K, Iwata K, Ueda M. Measurement of thickness of a thin film by means of laser interference at many incident angles. Opt Laser Eng 2003, in press.
5. Applied optics I and II, vol. 33(I) and 114(II);Tsuruta,1998
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