A Practical System for Measuring Film Thickness by Means of Laser Interference with Laminar-Like Laser-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A Practical System for Measuring Film Thickness by Means of Laser Interference with Laminar-Like Laser

Published:2004 Issue:7 Volume:32 Page:475-479
ISSN:0387-0200
Container-title:The Review of Laser Engineering
language:en
Short-container-title:The Review of Laser Engineering

Author:

ZHU Feng¹,ISHIKAWA Kazuhiko²,IBE Toru³,ASADA Katsuhiko¹,UEDA Masahiro⁴

Affiliation:

1. Department of Information Science, Faculty of Engineering, University of Fukui

2. Department of Electronics and Information Engineering, Fukui National College of Technology

3. North Tec. Co. Ltd.

4. Department of Human Ecology and Technology, Faculty of Education and Regional Studies, University of Fukui

Publisher

Laser Society of Japan

Link

http://www.jstage.jst.go.jp/article/lsj/32/7/32_7_475/_pdf

Reference11 articles.

1. Measurement of thickness of a thin film by means of laser interference at many incident angles

2. 2) M. Ueda and K. Ishikawa: Patent Pending No. 2002-86938.

3. 3) K. Ishikawa, F. Murase, Z. Feng, and M. Ueda: Rep. 308th Topical Meeting, Laser Soc. Jpn. Laser Measurements, No. RTM-03-09 (2003) p.23.

4. Real-time measurement of a thickness of a thin coating by means of sheet laser

5. 5) M. Ueda and K. Ishikawa: Patent Pending No. 2002-206290.

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A hybrid sensor for the measurement of a wide range of longitudinal surface displacement based on laser reflection and scattering;Measurement Science and Technology;2006-10-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP