Mechanical characterizations of η′-Cu6(Sn, In)5 intermetallic compound solder joint: Getting prepared for future nanobumps

Author:

Mao XingchaoORCID,An YuxuanORCID,Chen Yang,Zheng Gong,Hou Rui,Zhang Xinyu,Guo Yuzheng,Liu Sheng,Tu King-Ning,Liu YingxiaORCID

Funder

City University of Hong Kong

Shenzhen Science and Technology Innovation Commission

National Natural Science Foundation of China

University Grants Committee Research Grants Council

University Grants Committee

Publisher

Elsevier BV

Reference43 articles.

1. Nanotwinning-assisted structurally stable copper for fine-pitch redistribution layer in 2.5 D/3D IC packaging;Chen;J Mater Res Technol,2023

2. Characterization of low-height solder microbump bonding for fine-pitch inter-chip connection in 3DICs. 2019;Miwa;International 3D Systems Integration Conference (3DIC),2019

3. Recent progress in SLID bonding in novel 3D-IC technologies;Sun;J Alloys Compd,2020

4. Evaluation of the potential electromagnetic interference in vertically stacked 3D integrated circuits;Kapoor;Appl Sci,2020

5. Preparation and performance of Sn-based composite solder joints by solid-liquid low-temperature solder bonding technology;Wu;J Mater Res Technol,2023

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