On the flicker noise in submicron silicon MOSFETs
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference94 articles.
1. Noise as a diagnostic tool for quality and reliability of electronic devices
2. Low frequency noise in MOS transistors—II Experiments
3. Characterization of low 1/f noise in MOS transistors
4. Theory and experiments on surface 1/f noise
5. Low-frequency noise spectroscopy
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