Single-Quantum Measurement With a Multiple-Amplifier Sensing Charge-Coupled Device-Reference-Cited by-同舟云学术

Single-Quantum Measurement With a Multiple-Amplifier Sensing Charge-Coupled Device

Published:2024-06 Issue:6 Volume:71 Page:3732-3738
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Botti Ana M.¹,Cervantes-Vergara Brenda A.¹^ORCID,Chavez Claudio R.¹^ORCID,Chierchie Fernando²^ORCID,Drlica-Wagner Alex¹,Estrada Juan¹^ORCID,Moroni Guillermo Fernandez¹^ORCID,Holland Stephen E.³,Irigoyen Gimenez Blas Junior¹^ORCID,Lapi Agustin J.¹^ORCID,Villalpando Edgar Marrufo⁴,Haro Miguel Sofo⁵^ORCID,Tiffenberg Javier¹^ORCID,Uemura Sho¹^ORCID

Affiliation:

1. Fermi National Accelerator Laboratory, Batavia, IL, USA

2. Departamento de Ingeniería Eléctrica y de Computadoras (DIEC), Universidad Nacional del Sur (UNS), Bahía Blanca, Argentina

3. Lawrence Berkeley National Laboratory, Berkeley, CA, USA

4. Kavli Institute for Cosmological Physics and the Department of Physics, University of Chicago, Chicago, IL, USA

5. Instituto de Física Enrique Gaviola (CONICET), Universidad Nacional de Córdoba, Córdoba, Argentina

Funder

Director, Office of Science, of the U.S. Department of Energy

Javier Tiffenberg’s DOE Early Career research program and Guillermo Fernandez Moroni’s DOE Early Career research program

Laboratory Directed Research and Development Program of Fermi National Accelerator Laboratory

Fermi Research Alliance, LLC for the U.S. Department of Energy

National Aeronautics and Space Administration (NASA) Astrophysics Research and Analysis Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/16/10538150/10521851.pdf?arnumber=10521851

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3. Excess noise and other important characteristics of low light level imaging using charge multiplying CCDs

4. Silicon photomultiplier and its possible applications;Buzhan;Nucl. Instrum. Methods Phys. Res. A, Accel. Spectrom. Detect. Assoc. Equip.,2003

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