Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. MOS (Metal Oxide semiconductor) Physics and Technology;Nicollian,1982
2. Surface potential transients of ultrathin SiO2–Si structures;Mizsei;Solid-State Electron,1991
3. Surface potential mapping: comparison of the vibrating capacitor and the SPV method;Mizsei;Solid-State Electron,2000
4. Semiconductor Material and Device Characterisation;Dieter Schroder,1990
5. Peters MA. COS testing combines expanded charge monitoring capabilities with reduced costs. Semiconductor Fabtech. London: ICG Publishing; 1995
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