Effect of Layer-by-Layer Electrostatic Assemblies on the Surface Potential and Current Voltage Characteristic of Metal−Insulator−Semiconductor Structures-Reference-Cited by-同舟云学术

Effect of Layer-by-Layer Electrostatic Assemblies on the Surface Potential and Current Voltage Characteristic of Metal−Insulator−Semiconductor Structures

Published:2009-10-01 Issue:21 Volume:25 Page:12529-12534
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Gorin D. A.¹²,Yashchenok A. M.²,Manturov A. O.³,Kolesnikova T. A.²,Möhwald H.¹

Affiliation:

1. Department of Interfaces, Max-Planck Institute of Colloids and Interfaces, Golm/Potsdam D14476, Germany

2. Faculty of Nano- and Biomedical Technologies, Saratov State University, Saratov 410012, Russia

3. Faculty of Electronics Engineering and Instrument-Making, Saratov State Technical University, Saratov 410054, Russia

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la901379d

Reference62 articles.

1. Buildup of ultrathin multilayer films by a self-assembly process: III. Consecutively alternating adsorption of anionic and cationic polyelectrolytes on charged surfaces

2. Reversibly erasable nanoporous anti-reflection coatings from polyelectrolyte multilayers

3. The influence of void space on antireflection coatings of silica nanoparticle self-assembled films

4. Assembly and characterization of colloid-based antireflective coatings on multicrystalline silicon solar cells

5. Superhydrophilic and Antireflective Properties of Silica Nanoparticle Coatings Fabricated via Layer-by-Layer Assembly and Postcalcination

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