Surface potential mapping: comparison of the vibrating capacitor and the SPV method

Author:

Mizsei János

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Surface potential transients of ultrathin SiO2–Si structures;Mizsei;Solid State Electronics,1991

2. Semiconductor material and device characterisation;Schroder,1990

3. Tunneling of electrons from Si into thermally grown SiO2;Weinberg;Solid State Electronics,1977

4. COS testing combines expanded charge monitoring capabilities with reduced costs;Peters,1995

5. Olfactory images by scanning Kelvin method;Mizsei;Sensors and Actuators,1998

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