Author:
de Almeida R.M.C.,Baumvol I.J.R.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials,General Chemistry
Reference153 articles.
1. G.E. Moore, IEEE IEDM Tech. Dig. 11 (1975).
2. Device scaling limits of Si MOSFETs and their application dependencies
3. L.C. Feldman, in: E.Y.J. Chabal (Ed.), Fundamental Aspects of Silicon Oxidation, Springer, Berlin, 2001, p. 1.
4. Applied physics review;Green;J. Appl. Phys.,2001
5. E.P. Gusev, in: G. Pachionni (Ed.), Defects in SiO2 and Related Dielectrics: Science and Technology, Kluwer Academic Publishers, Dordrecht, 2000, p. 1.
Cited by
133 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献