Behavior of the continuous X-ray background in grazing-exit electron probe X-ray microanalysis
Author:
Publisher
Elsevier BV
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference10 articles.
1. Quantitative Electron-Probe Microanalysis;Scott,1995
2. A formula for the background in TXRF as a function of the incidence angle and substrate material;Knoth;Spectrochim. Acta Part B,1999
3. Grazing-emission X-ray fluorescence spectrometry; principles and applications;de Bokx;Spectrochim. Acta Part B,1997
4. Grazing exit electron probe microanalysis for surface and particle analysis;Tsuji;Anal. Chem.,1999
5. Enhancement of electron-induced X-ray intensity for single particles under grazing exit conditions;Tsuji;Spectrochim. Acta Part B,1999
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1. Grazing-exit electron probe X-ray microanalysis (GE-EPMA): Fundamental and applications;Spectrochimica Acta Part B: Atomic Spectroscopy;2005-11
2. Micro X-ray flourescence instrument developed in combination with atomic force microscope;Powder Diffraction;2005-06
3. Grazing exit electron probe microanalysis of submicrometer precipitates in a copper base alloy;Spectrochimica Acta Part B: Atomic Spectroscopy;2004-08
4. X-ray Spectrometry;Analytical Chemistry;2004-05-08
5. Monte Carlo simulation of x-ray spectra generated by kilo-electron-volt electrons;Journal of Applied Physics;2003-04
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