A formula for the background in TXRF as a function of the incidence angle and substrate material-Reference-Cited by-同舟云学术

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A formula for the background in TXRF as a function of the incidence angle and substrate material

Published:1999-10 Issue:10 Volume:54 Page:1513-1515
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Knoth J.,Prange A.,Reus U.,Schwenke H.

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference4 articles.

1. Total Reflection X-ray Fluorescence Analysis;Klockenkämper,1997

2. Surface Studies of Solids by Total Reflection of X-Rays

3. Total reflection XRF, Ch. 9;Schwenke,1993

4. W.H. McMaster, N.K. Del Grande, J.H. Mallet, J.H. Hubell, Report UCRL-50174, Livermore, 1969.

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