Micro X-ray flourescence instrument developed in combination with atomic force microscope-Reference-Cited by-同舟云学术

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Micro X-ray flourescence instrument developed in combination with atomic force microscope

Published:2005-06 Issue:02 Volume:20 Page:137-140
ISSN:0885-7156
Container-title:Powder Diffraction
language:en
Short-container-title:Powder Diffr.

Author:

Tsuji K.,Emoto T.,Matsuoka Y.,Miyatake Y.,Nagamura T.,Ding X.

Publisher

Cambridge University Press (CUP)

Subject

Condensed Matter Physics,Instrumentation,General Materials Science,Radiation

Reference21 articles.

1. Takeoff angle‐dependent x‐ray fluorescence of layered materials using a glancing incident x‐ray beam

2. X‐Ray Spectrometry: Recent Technological Advances

3. Evaluation of Ni/Mn multilayer samples with glancing-incidence and take-off X-ray fluorescence analysis

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2. Role of Trace Elements in Breast Cancer and Their Characterization Using X-Ray Fluorescence Techniques;Trace Elements and Their Effects on Human Health and Diseases;2021-09-01

3. Grazing Emission X‐Ray Fluorescence: Novel Concepts and Applications for Nano‐Analytics;physica status solidi (b);2020-11-03

4. New developments of X-ray fluorescence imaging techniques in laboratory;Spectrochimica Acta Part B: Atomic Spectroscopy;2015-11

5. Laboratory-based micro-X-ray fluorescence setup using a von Hamos crystal spectrometer and a focused beam X-ray tube;Review of Scientific Instruments;2014-04

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