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Performance and characteristics of two total-reflection X-ray fluorescence and a particle induced X-ray emission setup for aerosol analysis

  • Published:1997-07 Issue:7 Volume:52 Page:977-984
  • ISSN:0584-8547
  • Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
  • language:en
  • Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Injuk Jasna,Van Grieken René,Klockenkämper Reinhold,von Bohlen Alex,Kump Peter

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Different Fields of Applications;Total-Reflection X-Ray Fluorescence Analysis and Related Methods;2014-12-19

2. Characterization of small particles by micro X-ray fluorescence;Spectrochimica Acta Part B: Atomic Spectroscopy;2005-11

3. The use of Si carriers for aerosol particle collection and subsequent elemental analysis by total-reflection X-ray fluorescence spectrometry;Spectrochimica Acta Part B: Atomic Spectroscopy;2003-12

4. Atmospheric particulate analysis by synchrotron radiation total reflection (SR-TXRF);X-Ray Spectrometry;2002-03

5. Grazing-incidence X-ray Absorption and Emission Spectroscopy;Reviews in Mineralogy and Geochemistry;2002-01-01
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