A highly sensitive energy-dispersive X-ray spectrometer with multiple total reflection of the exciting beam-Reference-Cited by-同舟云学术

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A highly sensitive energy-dispersive X-ray spectrometer with multiple total reflection of the exciting beam

Published:1982-02 Issue:1-2 Volume:193 Page:239-243
ISSN:0167-5087
Container-title:Nuclear Instruments and Methods in Physics Research
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research

Author:

Schwenke H.,Knoth J.

Publisher

Elsevier BV

Subject

General Engineering

Reference9 articles.

1. Optical Flats for Use in X‐Ray Spectrochemical Microanalysis

2. Total-reflection x-ray fluorescence spectrometric determination of elements in nanogram amounts

3. An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level

4. A new totally reflecting X-ray fluorescence spectrometer with detection limits below 10−11 g

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