Ion channeling effects in scanning ion microscopy with a 60 keV Ga+ probe-Reference-Cited by-同舟云学术

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Ion channeling effects in scanning ion microscopy with a 60 keV Ga+ probe

Published:1983-01 Issue:1-2 Volume:205 Page:299-309
ISSN:0167-5087
Container-title:Nuclear Instruments and Methods in Physics Research
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research

Author:

Levi-Setti Riccardo,Fox Timothy R.,Lam Kin

Publisher

Elsevier BV

Subject

General Engineering

Reference31 articles.

1. C. Fert, N. Colombie, B. Fagot and P. Van Chuong, in Le bombardment ionique, Coll. Int. du CNRS, Paris, No. 113/67, p. 67.

2. Emission electronique cinetique de cibles monocristallines metalliques

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