Author:
Langlois C.,Douillard T.,Yuan H.,Blanchard N.P.,Descamps-Mandine A.,Van de Moortèle B.,Rigotti C.,Epicier T.
Funder
CNRS
Région
‘GrandLyon
French Ministry of Research and Higher Education
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference31 articles.
1. Electron Backscatter Diffraction in Materials Science;Schwartz,2009
2. W. Yang, B. Adams, M.De Graef, Adaptive orientation imaging microscopy, in: Proceedings of the (ICOTOM 12): 12th International Conference on Textures of Materials, 1999, pp. 192–197.
3. Advances in high-speed EBSD orientation mapping;Maitland;Microsc. Microanal.,2007
4. Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction;Britton;Ultramicroscopy,2011
5. Errors, artifacts, and improvements in EBSD processing and mapping;Tao;Microsc. Microanal.,2005
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