Author:
Knippelberg W.,Becker O.,Wien K.
Cited by
18 articles.
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1. Secondary ion emission from various metals and the semiconductors Si and GaAs induced by mega-electronvolt ion impact;International Journal of Mass Spectrometry and Ion Processes;1993-07
2. Surface characterization with keV clusters and MeV ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-04
3. Nonlinear effects in desorption of valine with fast incident molecular ions;Physical Review B;1988-12-15
4. 252Cf-particle desorption mass spectrometry in a depth profiling mode;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-07
5. Variation of yield with thickness in SIMS and PDMS: Measurements of secondary ion emission from organized molecular films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-02