High Energy Sputtering from Cleaned Metal Foils

Author:

Krueger F. R.1,Wien K.1

Affiliation:

1. Institut für Kernphysik der Technischen Hochschule Darmstadt

Abstract

Abstract Positive and negative secondary ions desorbed from metal foils by bombardment with 252Cf fission products have been investigated by time-of-flight mass spectroscopy. The measurements were performed under UHV conditions using metal foils of Cu, Ni and Al cleaned by Ar-ion etching. Spectra were taken with cleaned surfaces and also under the exposure of H2 , O2 , N2 , CO, C2H4 , C2H6 and C3H7OH up to several 100 L. The yields of metal ions from clean metal surfaces are in agreement with Sigmund' theory.

Publisher

Walter de Gruyter GmbH

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy,Mathematical Physics

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1. Fabrication of Poly(ethylene glycol) Hydrogel Microstructures Using Photolithography;Langmuir;2001-07-18

2. Particle-Induced Desorption Ionization Techniques for Organic Mass Spectrometry;Ion Spectroscopies for Surface Analysis;1991

3. Surface characterization with keV clusters and MeV ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-04

4. A comparison of secondary ion mass spectra from keV and MeV ion bombarded vanadium, niobium and copper;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1985-10

5. Secondary electron emission from the entrance and exit surfaces of thin carbon foils under fast ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1985-06

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