A comparison of secondary ion mass spectra from keV and MeV ion bombarded vanadium, niobium and copper
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference38 articles.
1. Special Proc. 32nd Annual ASMS Conf.;Honig,1984
2. Characterization of solids and surfaces using ion beams and mass spectrometry
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4. Experimental and theoretical approaches to the ionization process in secondary-ion emission
5. The sputtering process and sputtered ion emission
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Target environment and energy deposition in particle induced desorption: 252Cf plasma desorption mass spectrometry, secondary ions mass spectrometry and fast atom bombardment mass spectrometry;International Journal of Mass Spectrometry and Ion Processes;1990-08
2. Fast heavy ion induced desorption;Radiation Effects and Defects in Solids;1989-07
3. Multiply charged ions from solids produced under energetic, heavy ion impact;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-04
4. Mechanisms in molecular SIMS;Chemical Reviews;1987-06
5. Secondary-ion emission from vanadium as a function of incident ion mass and energy in the range25–275keV;Physical Review B;1987-02-01
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