Detection of sputtered neutrals by multi-photon resonance ionization

Author:

Kimock F.M.,Baxter J.P.,Winograd N.

Publisher

Elsevier BV

Subject

General Engineering

Cited by 29 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Development of two-color resonant ionization sputtered neutral mass spectrometry and microarea imaging for Sr;Journal of Vacuum Science & Technology B;2020-07

2. New Light on the Chemistry of the Group 13 Metals;The Group 13 Metals Aluminium, Gallium, Indium and Thallium: Chemical Patterns and Peculiarities;2011-03-30

3. Development of resonance-enhanced multiphoton ionization SNMS for state-selective detection of sputtered atoms under low-energy ion irradiation;Surface and Interface Analysis;2011-01-26

4. Enhancement of Excited Secondary Fe Atoms under Oxygen Ion Bombardment;e-Journal of Surface Science and Nanotechnology;2009

5. Microarea analysis of iron and phosphorus by resonance photoionization sputtered neutral mass spectrometry;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2007-07

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