Author:
Mitchell I.V.,Eschbach H.L.,Avaldi L.,Dobma W.
Cited by
15 articles.
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1. The Si surface yield as a calibration standard for RBS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-03
2. Bismuth-Implanted Silicon Reference Material Revisited: The Concept of Traceability and the Individual Characterisation of Chips;Application of Particle and Laser Beams in Materials Technology;1995
3. Bi-implanted silicon reference material revisited: uniformity of the remaining batch;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03
4. Quantitative RBS analysis using RUMP. On the accuracy of the He stopping in Si;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-07
5. The CBNM scanning nuclear microprobe analytical facility;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-07