Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy-Reference-Cited by-同舟云学术

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Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Published:1999-02 Issue:3-4 Volume:140 Page:352-357
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Giessibl Franz J.,Bielefeldt Hartmut,Hembacher Stefan,Mannhart Jochen

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference18 articles.

1. Atomic Force Microscope

2. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

3. Observation of $\bf 7\times 7$ Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy

4. Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7×7

5. Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode

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