1. A unified explanation for secondary ion yields
2. F. Konishi, Y. Yoshioka, K. Kusao, Secondary Ion Mass Spectrometry, Vol. IV, Springer, Berlin, 1984, p. 256.
3. H. Gnaser, in: G. Gillen, R. Lareau, J. Bennet, F. Stevie (Eds.), SIMS, Vol. XI, Wiley, Chichester, 1998, p. 891.
4. K. Wittmaack, in: G. Gillen, R. Lareau, J. Bennet, F. Stevie (Eds.), SIMS, Vol. XI, Wiley, Chichester, 1998, pp. 11–18.
5. C.A. Evans Jr.;Chelgren;J. Vac. Sci. Technol.,1979