Author:
Konishi F.,Yoshioka Y.,Kusao K.
Publisher
Springer Berlin Heidelberg
Reference5 articles.
1. K. Kusao, Y. Yoshioka and F. Konishi: Mass Spectro. (Japan), 28, 21 (1980)
2. K. Wittmack: Int. J. Mass Spectrom. Ion Phys., 17, 39 (1975)
3. H. Liebl: J. Vac. Sci. Technol., 12, 385 (1975)
4. For example, R.K. Lewis: Surface Analysis for Silicon Devices, ARPA/NBS Workshop IV, 400–23, p p.45–59 (1976)
5. M. Kitagawa, K. Mori, S. Ishihara, M. Ohno, T. Hirao, Y. Yoshioka and S. Kohiki: J. Appl. Phys., 54, 3269 (1983)
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