Spatially resolved internal and external photoemission of Schottky barrier-Reference-Cited by-同舟云学术

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Spatially resolved internal and external photoemission of Schottky barrier

Published:1996-09 Issue: Volume:104-105 Page:196-203
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Coluzza C.,Almeida J.,dell'Orto Tiziana,Barbo F.,Bertolo M.,Bianco A.,Cerasari S.,Fontana S.,Bergossi O.,Spajer M.,Courjon D.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference16 articles.

1. An electrostatic microscope for synchrotron radiation x‐ray absorption microspectroscopy (invited)

2. Photoyield spectromicroscopy of silicon surfaces using monochromatic synchrotron radiation

3. Photoelectron holography for high-resolution spectromicroscopy

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1. Cr/Klorofil-a/n-GaP/Ag Aygıtının Akım-Gerilim Karakteristiklerinin İncelenmesi;Düzce Üniversitesi Bilim ve Teknoloji Dergisi;2023-10-24

2. Preliminary Remarks and Historical Overview;Internal Photoemission Spectroscopy;2014

3. Photocurrent imaging of CdS/Al interfaces based on microscopic analysis;Applied Optics;2013-07-18

4. References;Internal Photoemission Spectroscopy;2008

5. The correlation of electronic properties with nanoscale morphological variations measured by SPM on semiconductor devices;Journal of Physics: Condensed Matter;2003-10-13

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