The correlation of electronic properties with nanoscale morphological variations measured by SPM on semiconductor devices
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/15/i=42/a=008/pdf
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5. Characterisation of the influence of multi-quantum barrier reflectors within GaInP/AlGaInP quantum well lasers using near-field imaging techniques;Applied Surface Science;2008-11
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