1. Use of a fast atom beam in ion microscopy (FABIM) for analysis of poorly conducting materials
2. Application of fast atom bombardment (FAB) for ion microscopy of a rock sample
3. N. Klaus, in: K.R. Spurny (Ed.), Physical and Chemical Characterization of Individual Airborne Particles, Ellis Horwood, Chichester, 1986, p. 331, and references cited therein.
4. H. Seyama, M. Soma, in: A. Benninghoven, Y. Nihei, R. Shimizu, H.W. Werner (Eds.), Proceedings of the Secondary Ion Mass Spectrometry SIMS IX, Wiley, Chichester, 1994, p. 953.
5. K. Okamoto (Ed.), Preparation, Analysis and Certification of Pond Sediment Certified Reference Material, Res. Rep. Natl. Inst. Environ. Stud., Japan, Vol. 38, 1982.