Use of a fast atom beam in ion microscopy (FABIM) for analysis of poorly conducting materials-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Use of a fast atom beam in ion microscopy (FABIM) for analysis of poorly conducting materials

Published:1985-08 Issue:4 Volume:7 Page:177-187
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Degrève F.,Lang J. M.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference12 articles.

1. Beam techniques for the analysis of poorly conducting materials

2. Static SIMS for applied surface analysis

3. Analysis of polymer surfaces by SIMS, 3?preliminary results from molecular imaging and microanalysis experiments

4. M. Chaintreau G. Slodzian R. Dennebuy J. Microsc. Spectrosc. Electron

5. F. M. Devienne J. C. Roustan CRAS (Paris) 276 1973

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Application of SIMS to the analysis of environmental samples;Applied Surface Science;2003-01

2. Electron flood charge compensation device for ion trap secondary ion mass spectrometry;International Journal of Mass Spectrometry;2002-11

3. X-ray photoelectron spectroscopy studies of plasma-modified PET surface and alumina/PET interface;Applied Surface Science;1997-07

4. Charge effects during surface analysis of poorly conducting inorganic materials;Fresenius' Journal of Analytical Chemistry;1991

5. Application of fast atom bombardment (FAB) for ion microscopy of a rock sample;Surface and Interface Analysis;1990-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP