In situ compositional control of advanced HgCdTe-based IR detectors
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference9 articles.
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4. The growth of high-quality MCT films by MBE using in-situ ellipsometry
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1. In-situ ellipsometric study on composition-dependent short-wave HgCdTe in the process of molecular beam epitaxy growth;Earth and Space: From Infrared to Terahertz (ESIT 2022);2023-01-31
2. Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg1 – xCdхTe Films Grown Using Molecular Beam Epitaxy;Optics and Spectroscopy;2021-01
3. Parametric Model of the Optical Constant Spectra of Hg1 – xCdxTe and Determination of the Compound Composition;Optics and Spectroscopy;2020-12
4. Molecular-Beam Epitaxial Growth of HgCdTe;Springer Handbook of Crystal Growth;2010
5. Improved model of HgCdTe's pseudo dielectric function for in-situ ellipsometry data analysis during MBE growth;Materials for Infrared Detectors II;2002-12-01
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