In-situ ellipsometric study on composition-dependent short-wave HgCdTe in the process of molecular beam epitaxy growth-Reference-Cited by-同舟云学术

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In-situ ellipsometric study on composition-dependent short-wave HgCdTe in the process of molecular beam epitaxy growth

Published:2023-01-31 Issue: Volume: Page:
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Container-title:Earth and Space: From Infrared to Terahertz (ESIT 2022)
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Author:

Yang Liao,Shen Chuan,Chen Lu,He Li

Publisher

SPIE

Reference29 articles.

1. Advances in HgCdTe-based infrared detector materials: The role of molecular-beam epitaxy [J];Lyon,2001

2. HgTe/HgCdTe superlattices grown on CdTe/Si by molecular beam epitaxy for infrared detection

3. Progress on HgCdTe MBE for the application of IRFPAs [J];Chen;Scientia Sinica (Physica,Mechanica and Astronomica),2014

4. HOT mid-wave HgCdTe nBn and pBp infrared detectors

5. Advanced HgCdTe technologies and dual-band developments [J];Tribolet,2008

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