Ellipsometry: a technique for real time monitoring and analysis of MBE-grown CdHgTe and CdTe/HgTe superlattices-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Ellipsometry: a technique for real time monitoring and analysis of MBE-grown CdHgTe and CdTe/HgTe superlattices

Published:1992-02 Issue:1-4 Volume:117 Page:166-170
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Hartley R.H.,Folkard M.A.,Carr D.,Orders P.J.,Rees D.,Varga I.K.,Kumar V.,Shen G.,Steele T.A.,Buskes H.,Lee J.B.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference5 articles.

1. Ellipsometry and Polarized Light;Azzam,1986

2. M.A. Folkard, D. Carr and R.H. Hartley, to be published.

3. Molecular‐beam epitaxy of CdxHg1−xTe at D.LETI/LIR

4. Kinetics of molecular‐beam epitaxial HgCdTe growth

5. MBE growth and characterization of Hg-based superlattices

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Real-Time Ellipsometry at High and Low Temperatures;ACS Omega;2023-01-17

2. 7.1.1 Quantum wells and superlattices containing Hg;Growth and Structuring;2013

3. Comparison of normal and inverted band structure HgTe/CdTe superlattices for very long wavelength infrared detectors;Journal of Electronic Materials;2005-06

4. In situ ellipsometry for control of Hg1−xCdxTe nanolayer structures and inhomogeneous layers during MBE growth;Thin Solid Films;2004-05

5. Dielectric and optical properties of BaTiO3/SrTiO3 and BaTiO3/BaZrO3 superlattices;Journal of Applied Physics;2002-02-15

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3