Plasma assisted polishing of single crystal SiC for obtaining atomically flat strain-free surface
Author:
Publisher
Elsevier BV
Subject
Industrial and Manufacturing Engineering,Mechanical Engineering
Reference19 articles.
1. Chemomechanical Polishing of Silicon Carbide;Zhou;Journal of the Electrochemical Society,1997
2. Effects of Process Parameter Variations on the Removal Rate in Chemical Mechanical Polishing of 4H–SiC;Neslen;Journal of Electronic Materials,2001
3. Effects of Substrate Surface Preparation on Chemical Vapor Deposition Growth of 4H–SiC Epitaxial Layers;Saddow;Journal of Electronic Materials,2001
4. Chemical and Mechanical Balance in Polishing of Electronic Materials for Defect-Free Surfaces;Lee;Annals of the CIRP,2009
5. Hybrid Polishing Mechanism of Single Crystal SiC Using Mixed Abrasive Slurry (MAS);Lee;Annals of the CIRP,2010
Cited by 146 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Preparation of SiO2@MnO2 composite abrasives and their performance in chemical-mechanical polishing of SiC substrates;Ceramics International;2024-10
2. Advances in finishing of optical complex substrates: A comprehensive review;Optics & Laser Technology;2024-09
3. Advanced polishing methods for atomic-scale surfaces: A review;Materials Today Sustainability;2024-09
4. Sustainable Electrochemical Mechanical Polishing (ECMP) for 4H-SiC wafer using chemical-free polishing slurry with hydrocarbon-based solid polymer electrolyte;Applied Surface Science;2024-08
5. Surface characteristics and material removal mechanisms during nanogrinding on C-face and Si-face of 4H-SiC crystals: Experimental and molecular dynamics insights;Applied Surface Science;2024-08
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3