Étude par spectrométrie Auger de films passifs formes sur le tantale en solution d'acide phosphorique-Reference-Cited by-同舟云学术

Étude par spectrométrie Auger de films passifs formes sur le tantale en solution d'acide phosphorique

Published:1976-01 Issue:1 Volume:9 Page:41-50
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:fr
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Romand M.,Bouyssoux G.,Solomon J.S.,Baun W.L.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Use of Auger Electron Spectroscopy and Inert Gas Sputtering for Obtaining Chemical Profiles

2. Application of auger electron spectroscopy to the determination of the composition of passive films on type 316 SS

3. Chemical shifts in the auger spectra of passive films

4. M. Romand, V. Meyers, J. Solomon et W. L. Baun, Mater. Res. Bull., à paraître.

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