Analyse de films minces et ultra-minces: Perspectives nouvelles en spectrométrie d'émission des rayons X
Author:
Publisher
Elsevier BV
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference17 articles.
1. Concentration profiles of passive films formed on niobium metal and niobium-base alloys by auger electron spectrometry
2. Étude par spectrométrie Auger de films passifs formes sur le tantale en solution d'acide phosphorique
3. Determination par fluorescence x du phosphore incorpore dans les films anodiques d'aluminium et de niobium formes en milieu phosphorique
4. Caracterisation par spectrometrie auger de films anodiques formes sur l'aluminium
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Recent Developments in Surface and Thin Film Analysis Using Low - Energy Electron Induced X - Ray Spectrometry (LEEIXS);Advances in X-Ray Analysis;1992
2. Recent Developments in Surface and Thin Film Analysis using Low - Energy Electron Induced X-Ray Spectrometry (LEEIXS);Advances in X-ray Analysis;1991
3. Surface and near-surface chemical characterization by low-energy electron-induced X-ray spectrometry (LEEIXS): A review;X-Ray Spectrometry;1987-01
4. Study of iron implanted MgO crystals by low-energy electron induced X-ray spectroscopy;Applied Surface Science;1985-08
5. Photoanodic behaviour of thin CdS films: Surface chemical modifications analyzed by XRFS, LEEIXS, and XPS;Applications of Surface Science;1985-04
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