Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY-Reference-Cited by-同舟云学术

Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY

Published:1999-06 Issue: Volume:101-103 Page:931-936
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Kleineberg U,Menke D,Hamelmann F,Heinzmann U,Schmidt O,Fecher G.H,Schoenhense G

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. PISAM: a photon-induced scanning Auger microscope

2. High resolution spectromicroscopy with MAXIMUM: Photoemission spectroscopy reaches the 1000 Å scale

3. Diffraction optics for X-ray imaging

4. Compact low-energy electron microscope for surface imaging

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