Author:
Adamec P.,Bauer E.,Lencová B.
Cited by
32 articles.
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1. Surface microscopy with low energy electrons: LEEM;Journal of Electron Spectroscopy and Related Phenomena;2020-05
2. WITHDRAWN: Surface microscopy with low energy electrons: LEEM;Journal of Electron Spectroscopy and Related Phenomena;2019-03
3. LEEM, SPLEEM and SPELEEM;Springer Handbook of Microscopy;2019
4. Electrostatic Lenses;Handbook of Charged Particle Optics;2017-12-19
5. Note: O-ring stack system for electron gun alignment;Review of Scientific Instruments;2015-01