Structural aspect of YBa2Cu3O7−x films on Si with complex barrier layers-Reference-Cited by-同舟云学术

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Structural aspect of YBa2Cu3O7−x films on Si with complex barrier layers

Published:1995-03 Issue:3-4 Volume:244 Page:373-388
ISSN:0921-4534
Container-title:Physica C: Superconductivity
language:en
Short-container-title:Physica C: Superconductivity

Author:

Vasiliev A.L.,Van Tendeloo G.,Amelinckx A.,Boikov Yu.,Olsson E.,Ivanov Z.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference48 articles.

1. A review of high-temperature superconducting films on silicon

2. Buffer layers for high-quality epitaxial YBCO films on Si

3. High critical currents in strained epitaxial YBa2Cu3O7−δon Si

4. Effects of homoepitaxial surfaces and interface compounds on the in-plane epitaxy of YBCO films on yttria-stabilized zirconia

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