Author:
Schuhrke T.,Mändl M.,Zweck J.,Hoffmann H.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Radiation damage effects in GaAs transmission electron microscopy specimens prepared by ion milling
2. Ion Implantation Range and Energy Deposition Tables, Vol. 2, Low Incident Ion Energies;Winterbon,1975
Cited by
30 articles.
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