A combined specimen-holder/detector for surface and transmission imaging of samples in a STEM/CTEM or SEM-Reference-Cited by-同舟云学术

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A combined specimen-holder/detector for surface and transmission imaging of samples in a STEM/CTEM or SEM

Published:1984-01 Issue:1-2 Volume:15 Page:109-117
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Valdré U.,Michelini G.,Sparrow T.G.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Application of scanning transmission electron microscopy to semiconductor devices

2. Observation of dislocations and microplasma sites in semiconductors by direct correlations of STEBIC, STEM and ELS

3. Electron beam current measurement in the electron microscope

4. An application of secondary electrons to STEM imaging

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Acceptance Angle Control for Improved Transmission Imaging in an SEM;Microscopy Today;2017-03

2. Integrated fiducial sample mount and software for correlated microscopy;Review of Scientific Instruments;2014-02

3. Control of specimen orientation and environment;Journal of Electron Microscopy Technique;1989-04

4. A double tilting cartridge for transmission electron microscopes with maximum solid angle of exit at the specimen;Journal of Microscopy;1985-07

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