1. Balk, L. J., Kubalek, E. and Menzel, E. 1975.Proceedings of the 8th S.E.M. Symposium, IITRI, Edited by: Johari, O. and Corvin, I. 447–55. U.S.A.: Chicago Press Corporation.
2. Method of preparing Si and Ge specimens for examination by transmission electron microscopy
3. Effect of dislocations on green electroluminescence efficiency in GaP grown by liquid phase epitaxy
4. Clarke, D. R. 1975.Electron Microscopy in Materials Science, Edited by: Ruedl, E. and Valdrè, U. Vol. IV, 1249–74. Luxembourg: Commission European Communities.