STEM electron beam-induced current measurements of organic-inorganic perovskite solar cells-Reference-Cited by-同舟云学术

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STEM electron beam-induced current measurements of organic-inorganic perovskite solar cells

Published:2020-10 Issue: Volume:217 Page:113047
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Duchamp M.,Hu H.,Lam Y.M.,Dunin-Borkowski R.E.,Boothroyd C.B.

Funder

Nanyang Technological University

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference26 articles.

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2. Combined scanning (EBIC) and transmission electron microscopic investigations of dislocations in semiconductors;Blumtritt;Phys. Status Solidi A,1979

3. A theoretical interpretation of the electrical behaviour of individual edge dislocations in Si as determined by combined EBIC/TEM studies;Ourmazd;Krist. Tech.,1981

4. Study of misfit dislocations by EBIC, CL and HRTEM in GaAs/InGaAs lattice-strained multi-quantum well p-i-n solar cells;Mazzer;Mater. Sci. Eng. B,1996

5. Observation of dislocations and microplasma sites in semiconductors by direct correlations of STEBIC, STEM and ELS;Fathy;J. Microsc.,1980

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2. Enhancement and Broadening of the Internal Electric Field of Hole-Transport-Layer-Free Perovskite Solar Cells by Quantum Dot Interface Modification;ACS Applied Materials & Interfaces;2024-01-30

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