Electron beam current measurement in the electron microscope-Reference-Cited by-同舟云学术

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Electron beam current measurement in the electron microscope

Published:1981-02 Issue:2 Volume:121 Page:141-147
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Nicholson W. A. P.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1981.tb01207.x/fullpdf

Reference9 articles.

1. Backscattering of 10-100 keV electrons from thick targets;Darlington;J. Phys. D: Appl. Phys.,1975

2. Backscattering and secondary electron emission of 10-100 keV electrons and correlations to scanning electron microscopy;Drescher;Z. angewandte Phys.,1970

3. Thin film X-ray spectrometry;Geiss;Ultramicroscopy,1979

4. Electron Beam-Specimen Interaction

5. Spurious X-rays in the scanning transmission electron microscope;Goldstein;Scanning Electron Microscopy,1978

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2. Spider (Araneus diadematus) cocoon silk: a case of non-periodic lattice crystals with a twist?;International Journal of Biological Macromolecules;1999-03

3. How to “See” Electrons;Transmission Electron Microscopy;1996

4. Effect of temperature on radiation damage to aromatic organic molecules;Ultramicroscopy;1992-02

5. Quantitative X-Ray Microanalysis of Ultra-Thin Resin-Embedded Biological Samples;Mikrochimica Acta;1992

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