High-resolution electron microscopy of quasi-amorphous materials
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. High Resolution Transmission Electron Microscopy and Associated Techniques;Self,1988
2. Bragg diffraction by amorphous silicon
3. Auto-correlation analysis of high resolution electron micrographs of near-amorphous thin films
4. Computer Processing of Electron Microscope Images;Frank,1980
5. Detection of local atomic ordering in high‐resolution electron images of quasiamorphous materials
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1. Analysis of high resolution transmission electron microscope images of crystalline–amorphous interfaces;Ultramicroscopy;2002-04
2. TEM-simulation of amorphous carbon films: influence of supercell packaging;Ultramicroscopy;2001-07
3. Quantitative analysis of HRTEM images from amorphous materials. I: About the estimation ofCsandδffrom HRTEM diffractograms;The European Physical Journal Applied Physics;1998-10
4. Quantitative criteria for the detection and characterization of nanocrystals from high-resolution electron microscopy images;Philosophical Magazine A;1995-09
5. Autocorrelation function analysis of phase formation in the initial stage of interfacial reactions of molybdenum thin films on (111)Si;Applied Physics Letters;1994-03-07
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